Project-related publications

  • M. Petrović, F. J. Meyer zu Heringdorf, M. Horn-von Hoegen, P. A. Thiel, and M. C. Tringides. Broad background in electron diffraction of 2D materials as a signature of their superior quality. Nanotechnology 32 505706 (2021) DOI: 10.1088/1361-6528/ac244f